On Reduction of Capture Power for Modular System-on-Chip Test
IEEE Workshop on RTL and High Level Testing (WRTLT'08), Sapporo, JAPAN, November 27-28, 2008.
ABSTRACT
[SL08] Virendra Singh, Erik Larsson, "On Reduction of Capture Power for Modular System-on-Chip Test", IEEE Workshop on RTL and High Level Testing (WRTLT'08), Sapporo, JAPAN, November 27-28, 2008. |
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