tobdu_date07

Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO

Tobias Dubois
 
Erik-Jan Marinissen Author homepage
Mohamed Azimane Author homepage
 
Paul Wielage Author homepage
Erik Larsson Author homepage
 
Clemens Wouters

Design, Automation, and Test in Europe (DATE), Nice, France, April 16-20, 2007, pp. 859-864.

ABSTRACT
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods.


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tobdu_date07.pdfAdobe Acrobat portable document


[DMAW07] Tobias Dubois, Erik-Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters, "Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO", Design, Automation, and Test in Europe (DATE), Nice, France, April 16-20, 2007, pp. 859-864.
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