ssocc06_zhihe

Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning

Zhiyuan He Author homepage
 
Zebo Peng Author homepage
Petru Eles Author homepage

Swedish System-on-Chip Conference (SSoCC'06), Kolmården, Sweden, May 4-5, 2006 (Informal Digest)

ABSTRACT


[HPE06] Zhiyuan He, Zebo Peng, Petru Eles, "Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning", Swedish System-on-Chip Conference (SSoCC'06), Kolmården, Sweden, May 4-5, 2006 (Informal Digest)
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)
Last modified on Monday December 04, 2006 by Gert Jervan