norchip04

An Improved Estimation Methodology for Hybrid BIST Cost Calculation

Gert Jervan Author homepage
 
Zebo Peng Author homepage
Raimund Ubar
 
Olga Korelina

IEEE Norchip 2004, Oslo, Norway, November 8-9, 2004, pp. 297-300

ABSTRACT
This paper presents an improved estimation methodology for hybrid BIST cost calculation. In a hybrid BIST approach the test set is assembled from pseudorandom and deterministic test patterns. The efficiency of the hybrid BIST approach is largely determined by the ratio of those test patterns in the final test set. Unfortunately exact algorithms for finding the test sets are computationally very expensive. Therefore in this paper we propose an improved estimation methodology for fast calculation of the hybrid test set. The methodology is based on real fault simulation results and experimental results have shown that the method is more accurate than the statistical method proposed earlier.


Related files:
norchip04.pdfAdobe Acrobat portable document

Copyright note for papers published by the IEEE Computer Society:
Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works, must be obtained from the IEEE.


[JPUK04] Gert Jervan, Zebo Peng, Raimund Ubar, Olga Korelina, "An Improved Estimation Methodology for Hybrid BIST Cost Calculation", IEEE Norchip 2004, Oslo, Norway, November 8-9, 2004, pp. 297-300
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)
Last modified on Monday December 04, 2006 by Gert Jervan