norchip03

Test Time Minimization for Hybrid BIST with Test Pattern Broadcasting

Raimund Ubar
 
Maksim Jenihhin
Gert Jervan Author homepage
 
Zebo Peng Author homepage

The 21st NORCHIP Conference, Riga, Latvia, November 10-11, 2003, pp. 112-116

ABSTRACT
This paper describes a hybrid BIST architecture for testing core-based systems together with a method for test time minimization. The approach uses test pattern broadcasting for both pseudorandom and deterministic patterns. To overcome the high complexity of the test time minimization problem we propose a fast algorithm to find an efficient combination of pseudorandom and deterministic test sets under given memory constraints. The efficiency of the approach is demonstrated by experimental results.


Related files:
norchip03.pdfAdobe Acrobat portable document
norchip03.poster.pdfPoster, Adobe Acrobat portable document


[UJJP03] Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng, "Test Time Minimization for Hybrid BIST with Test Pattern Broadcasting", The 21st NORCHIP Conference, Riga, Latvia, November 10-11, 2003, pp. 112-116
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