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nimag_GLSVLSI15

Efficient Test Application for Rapid Multi-Temperature Testing

Nima Aghaee
 
Zebo Peng Author homepage
Petru Eles Author homepage

25th Great Lakes Symposium on VLSI (GLSVLSI15), Pittsburgh, PA, USA, May 20-22, 2015.

ABSTRACT
Different defects may manifest themselves at different temperatures. Therefore, the tests that target such temperature-dependent defects must be applied at different temperatures appropriate for detecting them. Such multi-temperature testing scheme applies tests at different required temperatures. It is known that a testís power dissipation depends on the previously applied test. Therefore, the same set of tests when organized differently dissipates different amounts of power. The technique proposed in this paper organizes the tests efficiently so that the resulted power levels lead to the required temperatures. Consequently a rapid multi-temperature testing is achieved. Experimental studies demonstrate the efficiency of the proposed technique.


[APE15] Nima Aghaee, Zebo Peng, Petru Eles, "Efficient Test Application for Rapid Multi-Temperature Testing", 25th Great Lakes Symposium on VLSI (GLSVLSI15), Pittsburgh, PA, USA, May 20-22, 2015.
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)