nimag_DSD11

Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation

Nima Aghaee
 
Zebo Peng Author homepage
Petru Eles Author homepage

14th Euromicro Conference on Digital System Design (DSD11), Oulu, Finland, August 31 September 2, 2011.

ABSTRACT
High temperature and process variation are undesirable effects for modern systems-on-chip. The high temperature is a prominent issue during test and should be taken care of during the test process. Modern SoCs, affected by large process variation, experience rapid and large temperature deviations and, therefore, a traditional static test schedule which is unaware of these deviations will be suboptimal in terms of speed and/or thermal-safety. This paper presents an adaptive test scheduling method which addresses the temperature deviations and acts accordingly in order to improve the test speed and thermal-safety. The proposed method is divided into a computationally intense offline-phase, and a very simple online-phase. In the offline-phase a schedule tree is constructed, and in the online-phase the appropriate path in the schedule tree is traversed, step by step and based on temperature sensor readings. Experiments have demonstrated the efficiency of the proposed method.


Related files:
nimag_DSD11.pdfAdobe Acrobat portable document


[APE11] Nima Aghaee, Zebo Peng, Petru Eles, "Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation", 14th Euromicro Conference on Digital System Design (DSD11), Oulu, Finland, August 31 September 2, 2011.
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