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jaytu_wrtlt09

Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC

Jaynarayan T. Tudu
 
Erik Larsson
Virendra Singh
 
Hideo Fujiwara

10th IEEE Workshop on RTL and High Level Testing (WRTLT'09), Hongkong, China, November 27-28, 2009, pp. 43-48.

ABSTRACT


[TLSF09] Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara, "Scan Cell Reordering to Minimize Peak Power during Scan Testing of SoC", 10th IEEE Workshop on RTL and High Level Testing (WRTLT'09), Hongkong, China, November 27-28, 2009, pp. 43-48.
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)