ivauk_DAC12

Steady-State Dynamic Temperature Analysis and Reliability Optimization for Embedded Multiprocessor Systems

Ivan Ukhov
 
Min Bao
Petru Eles Author homepage
 
Zebo Peng Author homepage

Design Automation Conference (DAC 2012), San Francisco, CA, USA, June 3-7, 2012.

ABSTRACT
In this paper we propose an analytical technique for the steady-state dynamic temperature analysis (SSDTA) of multiprocessor systems with periodic applications. The approach is accurate and, moreover, fast, such that it can be included inside an optimization loop for embedded system design. Using the proposed solution, a temperature-aware reliability optimization, based on the thermal cycling failure mechanism, is presented. The experimental results confirm the quality and speed of our SSDTA technique, compared to the state of the art. They also show that the lifetime of an embedded system can significantly be improved, without sacrificing its energy eficiency, by taking into consideration, during the design stage, the steady-state dynamic temperature profile of the system.


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ivauk_DAC12.pdfAdobe Acrobat portable document


[UBEP12] Ivan Ukhov, Min Bao, Petru Eles, Zebo Peng, "Steady-State Dynamic Temperature Analysis and Reliability Optimization for Embedded Multiprocessor Systems", Design Automation Conference (DAC 2012), San Francisco, CA, USA, June 3-7, 2012.
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