gert_book_2_2005

Test Generation: A Hierarchical Approach

Gert Jervan Author homepage
 
Raimund Ubar
Zebo Peng Author homepage
 
Petru Eles Author homepage

Chapter in System-level Test and Validation of Hardware/Software Systems, Springer Series in Advanced Microelectronics, Vol. 17, ISBN 1-85233-899-7, 2005

http://www.springeronline.com/sgw/cda/frontpage/0,11855,5-10041-22-34954084-0,00.html

ABSTRACT


[JUPE05] Gert Jervan, Raimund Ubar, Zebo Peng, Petru Eles, "Test Generation: A Hierarchical Approach", Chapter in System-level Test and Validation of Hardware/Software Systems, Springer Series in Advanced Microelectronics, Vol. 17, ISBN 1-85233-899-7, 2005
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Last modified on Monday December 04, 2006 by Gert Jervan