SoC-Level Fault Management based on P1687 IJTAG
Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.
Event: Thu Mar 17, 2011: DIAMOND tutorial at DATE'11: Handling the challenges of debugging and reliability
Fault tolerance and fault management mechanisms are necessary means to reduce the impact of soft errors and wear out in electronic devices. The semiconductor products manufactured with latest and emerging processes are increasingly affected by these effects. The presentation describes a new general scalable fault management architecture based on the latest upcoming DFT standard IEEE P1687 IJTAG. The standard allows to create an efficient and regular network for handling fault detection information, manage test and system resources as a system-wide background process during system operation.
[CJL11] Gunnar Carlsson, Artur Jutman, Erik Larsson, "SoC-Level Fault Management based on P1687 IJTAG", Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.