ats03_gerje

Test Time Minimization for Hybrid BIST of Core-Based Systems

Gert Jervan Author homepage
 
Petru Eles Author homepage
Zebo Peng Author homepage
 
Raimund Ubar
Maksim Jenihhin

12th IEEE Asian Test Symposium (ATS03), Xian, China, November 17-19, 2003, pp. 318-323

ABSTRACT
This paper presents a solution to the test time minimization problem for core-based systems. We assume a hybrid BIST approach, where a test set is assembled, for each core, from pseudorandom test patterns that are generated online, and deterministic test patterns that are generated off-line and stored in the system. In this paper we propose an iterative algorithm to find the optimal combination of pseudorandom and deterministic test sets of the whole system, consisting of multiple cores, under given memory constraints, so that the total test time is minimized. Our approach employs a fast estimation methodology in order to avoid exhaustive search and to speed-up the calculation process. Experimental results have shown the efficiency of the algorithm to find a near optimal solutions.


Related files:
ats03_gerje.pdfAdobe Acrobat portable document
ats03_gerje.pspostscript document

Copyright note for papers published by the IEEE Computer Society:
Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works, must be obtained from the IEEE.


[JEPU03] Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, Maksim Jenihhin, "Test Time Minimization for Hybrid BIST of Core-Based Systems", 12th IEEE Asian Test Symposium (ATS03), Xian, China, November 17-19, 2003, pp. 318-323
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)
Last modified on Monday December 04, 2006 by Gert Jervan