andla_date07

Optimized Integration of Test Compression and Sharing for SOC Testing

Anders Larsson Author homepage
 
Erik Larsson Author homepage
Petru Eles Author homepage
 
Zebo Peng Author homepage

Design, Automation, and Test in Europe Conference (DATE'07), Nice, France, April 2007, pp. 207-212.

ABSTRACT
The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requirements. TAT and ATE memory requirement can be reduced by test architecture design, test scheduling, sharing the same tests among several cores, and test data compression. We propose, in contrast to previous work that addresses one or few of the problems, an integrated framework with heuristics for sharing and compression and a Constraint Logic Programming technique for architecture design and test scheduling that minimizes the TAT without violating a given ATE memory constraint. The significance of our approach is demonstrated by experiments with ITC’02 benchmark designs.


Related files:
andla_date07.pdfAdobe Acrobat portable document


[LLEP07] Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng, "Optimized Integration of Test Compression and Sharing for SOC Testing", Design, Automation, and Test in Europe Conference (DATE'07), Nice, France, April 2007, pp. 207-212.
( ! ) perl script by Giovanni Squillero with modifications from Gert Jervan   (v3.1, p5.2, September-2002-)
Last modified on Monday December 04, 2006 by Gert Jervan