WDTA98

Register-Transfer Level Testability Analysis and Improvement with Pseudorandom BIST

Tianruo Yang
 
Zebo Peng Author homepage

IEEE International Workshop on Design, Test and Applications of Electronic Systems (WDTA-98), Dubrovnik, Croatia, June 8-10, 1998, pp. 117-120.

ABSTRACT


[YP98] Tianruo Yang, Zebo Peng, "Register-Transfer Level Testability Analysis and Improvement with Pseudorandom BIST", IEEE International Workshop on Design, Test and Applications of Electronic Systems (WDTA-98), Dubrovnik, Croatia, June 8-10, 1998, pp. 117-120.
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