IEEE_CAD_ICS_04

Efficient Test Solutions for Core-based Designs

Erik Larsson Author homepage
 
Klas Arvidsson
Hideo Fujiwara
 
Zebo Peng Author homepage

IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, Vol.23, No.5, May 2004, pp. 758-775

ABSTRACT
A test solution for a complex system requires the design of a test access mechanism (TAM), which is used for the test data transportation, and a test schedule of the test data transportation on the designed TAM. An extensive TAM will lead to lower test-application time at the expense of higher routing costs, compared to a simple TAM with low routing cost but long testing time. It is also possible to reduce the testing time of a testable unit by loading the experiments on benchmarks as well as industrial designs in order to demonstrate that our approach produces high-quality solution at low computational cost.


Related files:
IEEE_CAD_ICS_04.final.pdf, Adobe Acrobat portable document

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[LAFP04] Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng, "Efficient Test Solutions for Core-based Designs", IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, Vol.23, No.5, May 2004, pp. 758-775
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