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AUTHOR:YING ZHANG
Found 2 entries
  1. Automatic Test Program Generation for Out-of-Order Superscalar Processors
    Ying Zhang, Ahmed Rezine, Petru Eles, Zebo Peng
    21st IEEE Asian Test Symposium (ATS 2012), Niigata, Japan, November 19-22, 2012.

  2. Automatic Test Program Generation Using Executing Trace Based Constraint Extraction for Embedded Processors
    Ying Zhang, Huawei Li, Xiaowei Li
    IEEE Transactions on Very Large Scale Integration Systems, 2012.

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