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AUTHOR:SANDEEP-KUMAR GOEL
Found 2 entries
  1. Improved Scan Chain Diagnosis
    Erik-Jan Marinissen, Dan Adolfsson, Erik Larsson, Sandeep-Kumar Goel
    15th NXP IC Test Symposium (NITS'07), Eindhoven, The Netherlands, June 11, 2007 (Informal Digest)

  2. Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
    Urban Ingelsson, Sandeep-Kumar Goel, Erik Larsson, Erik-Jan Marinissen
    IEEE European Test Symposium (ETS'05), Tallinn, Estonia, May 22-25, 2005, pp. 8-13

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