- Temperature-Gradient Based Burn-In for 3D Stacked ICs
Nima Aghaee, Zebo Peng, Petru Eles
The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).
- Process-variation and Temperature Aware SoC Test Scheduling Technique
Nima Aghaee, Zebo Peng, Petru Eles
Journal of Electronic Testing: Theory and Applications, 2013.
- Process-Variation and Temperature Aware SoC Test Scheduling Using Particle Swarm Optimization
Nima Aghaee, Zebo Peng, Petru Eles
The 6th IEEE International Design and Test Workshop (IDT 2011), Beirut, Lebanon, December 11–14, 2011.
- Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
Nima Aghaee, Zebo Peng, Petru Eles
14th Euromicro Conference on Digital System Design (DSD11), Oulu, Finland, August 31 – September 2, 2011.
- Heuristics for Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
Nima Aghaee, Zebo Peng, Petru Eles
The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
- Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation
Nima Aghaee, Zhiyuan He, Zebo Peng, Petru Eles
19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
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