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AUTHOR:NIMA AGHAEE
Found 14 entries
  1. Thermal Issues in Testing of Advanced Systems on Chip
    Nima Aghaee Ghaleshahi
    PhD Thesis No. 1702, Dept. of Computer and Information Science, Linköping University, December 2015 (Opponent: Professor Jaan Raik, Tallinn University of Technology, Tallinn, Estonia).
  2. A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    Journal of Electronic Testing: Theory and Applications 2015
  3. Efficient Test Application for Rapid Multi-Temperature Testing
    Nima Aghaee, Zebo Peng, Petru Eles
    25th Great Lakes Symposium on VLSI (GLSVLSI15), Pittsburgh, PA, USA, May 20-22, 2015.
  4. An Integrated Temperature-Cycling Acceleration and Test Technique for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    20th Asia and South Pacific Design Automation Conference (ASP-DAC 2015), Chiba/Tokyo, Japan, Jan. 19-22, 2015.
  5. Temperature-Gradient Based Burn-In and Test Scheduling for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    IEEE Transactions on Very Large Scale Integration Systems (VLSI 2015).
  6. Temperature-Gradient Based Test Scheduling for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    20th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2013), Abu Dhabi, United Arab Emirates, December 9-12, 2013.
  7. Process-Variation Aware Multi-Temperature Test Scheduling
    Nima Aghaee, Zebo Peng, Petru Eles
    27th International Conference on VLSI Design (VLSID 2014), IIT Bombay, Mumbai, India, January 5-9, 2014.
  8. An Efficient Temperature-Gradient Based Burn-In Technique for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    Design, Automation & Test in Europe (DATE 2014), Dresden, Germany, March 24-28, 2014.
  9. Temperature-Gradient Based Burn-In for 3D Stacked ICs
    Nima Aghaee, Zebo Peng, Petru Eles
    The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).
  10. Process-variation and Temperature Aware SoC Test Scheduling Technique
    Nima Aghaee, Zebo Peng, Petru Eles
    Journal of Electronic Testing: Theory and Applications, Aug. 2013, Volume 29, Issue 4, pp. 499-520.
  11. Process-Variation and Temperature Aware SoC Test Scheduling Using Particle Swarm Optimization
    Nima Aghaee, Zebo Peng, Petru Eles
    The 6th IEEE International Design and Test Workshop (IDT 2011), Beirut, Lebanon, December 1114, 2011.
  12. Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
    Nima Aghaee, Zebo Peng, Petru Eles
    14th Euromicro Conference on Digital System Design (DSD11), Oulu, Finland, August 31 September 2, 2011.
  13. Heuristics for Adaptive Temperature-Aware SoC Test Scheduling Considering Process Variation
    Nima Aghaee, Zebo Peng, Petru Eles
    The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
  14. Temperature-Aware SoC Test Scheduling Considering Inter-Chip Process Variation
    Nima Aghaee, Zhiyuan He, Zebo Peng, Petru Eles
    19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
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