- Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Tobias Dubois, Erik-Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters
Design, Automation, and Test in Europe (DATE), Nice, France, April 16-20, 2007, pp. 859-864.
- High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
Tobias Dubois, Mohamed Azimane, Erik Larsson, Erik-Jan Marinissen, Paul Wielage, Clemens Wouters
14th Philips Research IC Test Seminar (PRITS), Eindhoven, The Netherlands, June 27, 2006
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