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AUTHOR:GUNNAR CARLSSON
Found 20 entries
  1. Scenario-Based Network Design for P1687
    Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson
    The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).
  2. An MPSoCs Demonstrator for Fault Injection and Fault Handling in an IEEE P1687 Environment
    Kim Petersen, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    IEEE 17th European Test Symposimu (ETS 2012), Annecy, France, May 28-June 1, 2012.
  3. A Study of Instrument Reuse and Retargeting in P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
    IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011), MNIT Jaipur, India, November 25-26, 2011.
  4. Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
    IEEE Design & Test of Computers, Apr. 2012, Volume 29, Issue 2, pp. 79-88.
  5. Access Time Analysis for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    IEEE Transactions on Computers, Oct. 2012, Volume 61, Issue 10, pp 1459-1472.
  6. Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
    Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson
    20th IEEE Asian Test Symposium (ATS 2011), New Delhi, India, November 21-23, 2011.
  7. Test Scheduling with Constraints for IEEE P1687 (poster)
    Golnaz Asani, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    International Test Conference (ITC 2011), Anaheim, CA, USA, September 18-23, 2011.
  8. Automated Design for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
  9. SoC-Level Fault Management based on P1687 IJTAG
    Gunnar Carlsson, Artur Jutman, Erik Larsson
    Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.
  10. Test scheduling on IJTAG
    Erik Larsson, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson
    Nordic Test Forum (NTF 2010), Drammen, Norway, November 23-24, 2010.
  11. Design Automation for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.
  12. Efficient Embedding of Deterministic Test Data
    Mudassar Majeed, Daniel Ahlström, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
  13. Test Time Analysis for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
  14. Efficient Embedding of Deterministic Test Data
    Mudassar Majeed, Daniel Ahlström, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    Swedish SoC Conference 2010, Kolmården, Sweden, May 3-4, 2010 (not reviewed, not printed)
  15. Protocol Requirements in an SJTAG/IJTAG Environment
    Erik Larsson, Gunnar Carlsson, Johan Holmqvist
    Nordic Test Forum (NTF), November 2007, Snekkersten, Denmark.
  16. Protocol Requirements in an SJTAG/IJTAG Environment
    Gunnar Carlsson, Johan Holmqvist, Erik Larsson
    International Test Conference (ITC), Santa Clara, USA, October 21-26, 2007, Lecture 1.3 (pp. 1-9).
  17. Extended STAPL as SJTAG Engine
    Johan Holmqvist, Gunnar Carlsson, Erik Larsson
    IEEE European Test Symposium, Freiburg, Germany, May, 2007, pp. 119-124.
  18. Remote Boundary-Scan System Test Control for the ATCA Standard
    David Bäckström, Gunnar Carlsson, Erik Larsson
    International Test Conference (ITC'05), Austin, Texas, USA, November 8-10, 2005
  19. Boundary-Scan Test Control in the ATCA Standard
    David Bäckström, Gunnar Carlsson, Erik Larsson
    IEEE European Board Test Workshop, EBTW, Tallinn, Estonia, 25-26 May 2005
  20. The Design and Optimization of SOC Test Solutions
    Erik Larsson, Zebo Peng, Gunnar Carlsson
    ICCAD-2001, DoubleTree Hotel, San Jose, California, November 4-8, 2001, pp. 523-530
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