Search Results

AUTHOR:FARROKH GHANI ZADEGAN
Found 10 entries
  1. Scenario-Based Network Design for P1687
    Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson
    The 12th Swedish System-on-Chip Conference (SSoCC 2013), Ystad, Sweden, May 6-7, 2013 (not reviewed, not printed).
  2. A Study of Instrument Reuse and Retargeting in P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
    IEEE Twelfth Workshop on RTL and High Level Testing (WRTLT 2011), MNIT Jaipur, India, November 25-26, 2011.
  3. Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson
    IEEE Design & Test of Computers, Apr. 2012, Volume 29, Issue 2, pp. 79-88.
  4. Access Time Analysis for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    IEEE Transactions on Computers, Oct. 2012, Volume 61, Issue 10, pp 1459-1472.
  5. Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
    Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson
    20th IEEE Asian Test Symposium (ATS 2011), New Delhi, India, November 21-23, 2011.
  6. Test Scheduling with Constraints for IEEE P1687 (poster)
    Golnaz Asani, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    International Test Conference (ITC 2011), Anaheim, CA, USA, September 18-23, 2011.
  7. Automated Design for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    The 11th Swedish System-on-Chip Conference, Varberg, Sweden, May 2-3, 2011 (not reviewed, not printed).
  8. Test scheduling on IJTAG
    Erik Larsson, Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson
    Nordic Test Forum (NTF 2010), Drammen, Norway, November 23-24, 2010.
  9. Design Automation for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    Design, Automation and Test in Europe (DATE 2011), Grenoble, France, March 14-18, 2011.
  10. Test Time Analysis for IEEE P1687
    Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson
    19th IEEE Asian Test Symposium (ATS10), Shanghai, China, December 1-4, 2010.
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