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VLSI Test Principels and Challenges

2011VT

Status Cancelled
School Computer and Information Science (CIS)
Division ESLAB
Owner Erik Larsson

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Course plan

No of lectures

12

Recommended for

PhD students in computer systems and electrical engineering

The course was last given

2007 (a version at isy)

Goals

The purpose of the course is that students shall acquire knowledge on the importance of design of testable systems and develop the ability to formulate and solve problems related to testing. After completing the course, students shall be able to:
- describe for fundamental test and fault concepts
- methodical solve test related problems in a development environment
- formulate and implement/apply test algorithms
- define and implement a minor design-for-test assignment

Prerequisites

The course requires basic computer knowledge, basic programming, basic digital circuit design, basic computer architecture, and basic design of digital systems.

Organization

The course is organized in four parts; introduction to design for test, advanced fault models, mixed-signal test and processes variations and design challenges.

The first part - introduction to design for test - details the basics in design-for-test, which includes test generations, design modifications to enable test and design of test architectures.

The second part - advanced fault models - discusses new problem arising in latest semiconductor technologies.

The third part - mixed signal testing - describes how to test the increasing part of mixed signal (digital and analog) parts of integrated circuits.

The fourth part - process variations and design challenges - details current and future challenges and the need of advancing the testing for these systems.

Contents

The following topics are addressed for digital and mixed-signal systems:
- defects, fault models and test generation
- test preparation and design-for-test techniques
- test application

Literature

Introduction to Advanced System-on-Chip Test Design and Optimization, Erik Larsson, Series: Frontiers in Electronic Testing , Vol. 29, 2005, XVI, 388 p., Hardcover, ISBN: 978-1-4020-3207-3

Scientific articles

Lecturers

Erik Larsson
Urban Ingelsson
Jerzy Dabrowski
Atila Alvandpour
Invited speakers

Examiner

Erik Larsson

Examination

Part 1 - Labs
Part 2 - Hand-in assignment
Part 3 - Exam
Part 4 - Homework studies and report

Credit

8hp

Comments

The hardware, integrated circuits and printed circuit boards, of computer systems is becoming increasingly complex and advanced. Performance and functionality demands enforce highly advanced mixed-signal systems consisting of digital and analog parts. Manufacturing of these systems is far from perfect and testing is needed. Testing is a major challenge and test cost is an increasing part of the overall cost.


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Last updated: 2012-05-03